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Failure Scenario of Power Supply Due to Conducted Electric Pulse From E1 HEMP

dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorMEJECAZE, Guillaume
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDUBOIS, Tristan
IDREF: 139527613
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorCUROS, Laurine
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorVINASSA, Jean-Michel
IDREF: 078898064
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorPUYBARET, Frederic
dc.date.accessioned2023-12-20T09:37:24Z
dc.date.available2023-12-20T09:37:24Z
dc.date.issued2023-04-01
dc.identifier.issn0018-9375en_US
dc.identifier.urioai:crossref.org:10.1109/temc.2022.3227335
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/186750
dc.description.abstractEnThis article presents the effects of a high amplitude conducted electromagnetic pulse on the electrical behavior of a flyback switch-mode power supply. The electromagnetic pulse is generated by a current injection platform that is able to reproduce differential or common mode parasitic currents and voltages induced by the coupling between E1 high-altitude nuclear electromagnetic pulse and a global electrical network. In this article, injections are performed in differential mode until the destruction of power supply. Current and voltage measurements have been performed around each destroyed component during the injection. Finally, these destruction tests, associated with spice simulations and component analyses, permit to build a power supply destruction scenario with the component's failures chronology modeling. This scenario is the first step in order to model the susceptibility of power supplies during an electrical pulse injection.
dc.language.isoENen_US
dc.sourcecrossref
dc.subject.enComponent analysis
dc.subject.enComponent destruction
dc.subject.enE1 high-altitude nuclear electromagnetic pulse (E1 HEMP)
dc.subject.enFailure scenario
dc.subject.enSpice simulation
dc.subject.enSusceptibility
dc.subject.enSwitch-mode power supplies
dc.title.enFailure Scenario of Power Supply Due to Conducted Electric Pulse From E1 HEMP
dc.title.alternativeIEEE Trans. Electromagn. Compat.en_US
dc.typeArticle de revueen_US
dc.identifier.doi10.1109/temc.2022.3227335en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.journalIEEE Transactions on Electromagnetic Compatibilityen_US
bordeaux.page464-474en_US
bordeaux.volume65en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.issue2en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.peerReviewedouien_US
bordeaux.inpressnonen_US
bordeaux.import.sourcedissemin
hal.identifierhal-04355308
hal.version1
hal.date.transferred2023-12-20T09:37:26Z
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exporttrue
workflow.import.sourcedissemin
dc.rights.ccPas de Licence CCen_US
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