MEJECAZE, Guillaume; DUBOIS, Tristan; CUROS, Laurine; VINASSA, Jean-Michel; PUYBARET, Frederic

doi:10.1109/temc.2022.3227335

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MEJECAZE, Guillaume
Laboratoire de l'intégration, du matériau au système [IMS]
Commissariat à l'énergie atomique et aux énergies alternatives [CEA]
CEA - Centre de Gramat

DUBOIS, Tristan

Laboratoire de l'intégration, du matériau au système [IMS]

CUROS, Laurine

Laboratoire de l'intégration, du matériau au système [IMS]
CEA - Centre de Gramat

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IEEE Transactions on Electromagnetic Compatibility. 2023-04-01, vol. 65, n° 2, p. 464-474

Resumen en inglés

This article presents the effects of a high amplitude conducted electromagnetic pulse on the electrical behavior of a flyback switch-mode power supply. The electromagnetic pulse is generated by a current injection platform that is able to reproduce differential or common mode parasitic currents and voltages induced by the coupling between E1 high-altitude nuclear electromagnetic pulse and a global electrical network. In this article, injections are performed in differential mode until the destruction of power supply. Current and voltage measurements have been performed around each destroyed component during the injection. Finally, these destruction tests, associated with spice simulations and component analyses, permit to build a power supply destruction scenario with the component's failures chronology modeling. This scenario is the first step in order to model the susceptibility of power supplies during an electrical pulse injection.< Leer menos

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Component analysis

Component destruction

E1 high-altitude nuclear electromagnetic pulse (E1 HEMP)

Failure scenario

Spice simulation

Susceptibility

Switch-mode power supplies

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Failure Scenario of Power Supply Due to Conducted Electric Pulse From E1 HEMP

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