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dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorMAURES, Matthieu
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorCAPITAINE, Armande
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDELETAGE, Jean-Yves
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorVINASSA, Jean-Michel
IDREF: 078898064
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorBRIAT, Olivier
IDREF: 069133980
dc.date.accessioned2023-12-20T08:59:35Z
dc.date.available2023-12-20T08:59:35Z
dc.date.issued2020-11-01
dc.identifier.issn0026-2714en_US
dc.identifier.urioai:crossref.org:10.1016/j.microrel.2020.113798
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/186746
dc.description.abstractEnIn this paper, an extension to high C-rates of State of Health (SoH) diagnostic methods based on Incremental Capacity (IC) peak tracking is proposed. A set of eleven NCA Lithium-ion batteries who went under different ageing protocol is used. Charge and discharge cycles are performed at C/20, C/10, C/5 and C/2, and then used for IC analysis. Correlations between the variations of IC peaks and SoH are presented and modelized, and shown to be accurate estimators for all tested C-rates.
dc.language.isoENen_US
dc.rightsAttribution-NonCommercial 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/3.0/us/*
dc.sourcecrossref
dc.title.enLithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
dc.typeArticle de revueen_US
dc.identifier.doi10.1016/j.microrel.2020.113798en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.journalMicroelectronics Reliabilityen_US
bordeaux.page113798en_US
bordeaux.volume114en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.peerReviewedouien_US
bordeaux.inpressnonen_US
bordeaux.import.sourcedissemin
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exportfalse
workflow.import.sourcedissemin
dc.rights.ccCC BY-NCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2020-11-01&rft.volume=114&rft.spage=113798&rft.epage=113798&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=MAURES,%20Matthieu&CAPITAINE,%20Armande&DELETAGE,%20Jean-Yves&VINASSA,%20Jean-Michel&BRIAT,%20Olivier&rft.genre=article


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