Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
| dc.rights.license | open | en_US |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | MAURES, Matthieu | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | CAPITAINE, Armande | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | DELETAGE, Jean-Yves | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | VINASSA, Jean-Michel
IDREF: 078898064 | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | BRIAT, Olivier
IDREF: 069133980 | |
| dc.date.accessioned | 2023-12-20T08:59:35Z | |
| dc.date.available | 2023-12-20T08:59:35Z | |
| dc.date.issued | 2020-11-01 | |
| dc.identifier.issn | 0026-2714 | en_US |
| dc.identifier.uri | oai:crossref.org:10.1016/j.microrel.2020.113798 | |
| dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/186746 | |
| dc.description.abstractEn | In this paper, an extension to high C-rates of State of Health (SoH) diagnostic methods based on Incremental Capacity (IC) peak tracking is proposed. A set of eleven NCA Lithium-ion batteries who went under different ageing protocol is used. Charge and discharge cycles are performed at C/20, C/10, C/5 and C/2, and then used for IC analysis. Correlations between the variations of IC peaks and SoH are presented and modelized, and shown to be accurate estimators for all tested C-rates. | |
| dc.language.iso | EN | en_US |
| dc.rights | Attribution-NonCommercial 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc/3.0/us/ | * |
| dc.source | crossref | |
| dc.title.en | Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application | |
| dc.type | Article de revue | en_US |
| dc.identifier.doi | 10.1016/j.microrel.2020.113798 | en_US |
| dc.subject.hal | Sciences de l'ingénieur [physics] | en_US |
| bordeaux.journal | Microelectronics Reliability | en_US |
| bordeaux.page | 113798 | en_US |
| bordeaux.volume | 114 | en_US |
| bordeaux.hal.laboratories | IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218 | en_US |
| bordeaux.institution | Université de Bordeaux | en_US |
| bordeaux.institution | Bordeaux INP | en_US |
| bordeaux.institution | CNRS | en_US |
| bordeaux.peerReviewed | oui | en_US |
| bordeaux.inpress | non | en_US |
| bordeaux.import.source | dissemin | |
| hal.popular | non | en_US |
| hal.audience | Internationale | en_US |
| hal.export | false | |
| workflow.import.source | dissemin | |
| dc.rights.cc | CC BY-NC | en_US |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2020-11-01&rft.volume=114&rft.spage=113798&rft.epage=113798&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=MAURES,%20Matthieu&CAPITAINE,%20Armande&DELETAGE,%20Jean-Yves&VINASSA,%20Jean-Michel&BRIAT,%20Olivier&rft.genre=article |
