Afficher la notice abrégée

dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorCUROS, Laurine
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDUBOIS, Tristan
IDREF: 139527613
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorMEJECAZE, G.
hal.structure.identifierCEA - Centre de Gramat
dc.contributor.authorPUYBARET, F.
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorPLANO, Bernard
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorVINASSA, Jean-Michel
IDREF: 078898064
dc.date.accessioned2023-12-18T08:00:36Z
dc.date.available2023-12-18T08:00:36Z
dc.date.issued2020-11-01
dc.identifier.issn0026-2714en_US
dc.identifier.urioai:crossref.org:10.1016/j.microrel.2020.113936
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/186678
dc.description.abstractEnThis paper presents an investigation aiming to determine the thresholds that lead to the destruction of power supplies components, such as rectifier bridge and rectifier diode, under differential mode electric pulse injection in the case of High Electromagnetic Pulse (HEMP) scenario. The coupling of HEMP field on long power lines generates high level current and voltage pulse disturbances which can propagate on the power network and flow into power supply input stages such as switch-mode power supplies (SMPS) present on main powered equipment. As a consequence of this injected parasitic, different electrical stresses occur inside the SMPS at electronic components level leading to cascaded destruction events. During a previous study, some internal electrical stresses have been measured and identified as the destruction cause of critical components such as rectifier bridge or rectifier diode. An electrical stress generator made of different capacitor cells is built to reproduce the electric pulses which will be present at the SMPS components terminals during their destruction. Oscilloscope associated to current and differential voltage probes are used to determine the failure moment. The performed tests have shown that rectifier bridge destruction follows a Wunsch and Bell law in current and in power according to the injection pulse duration. Concerning the rectifier diode, its destruction is due to its reverse voltage which has been measured around 135 V. This information will be used, in a future work, to better understand the destruction mechanism observed on complete power supplies and build behavioural models able to predict the destruction of power supplies in the case of HEMP scenario.
dc.language.isoENen_US
dc.rightsAttribution-NonCommercial 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/3.0/us/*
dc.sourcecrossref
dc.title.enInvestigation of critical parameters in power supplies components failure due to electric pulse
dc.title.alternativeMicroelectron Reliaben_US
dc.typeArticle de revueen_US
dc.identifier.doi10.1016/j.microrel.2020.113936en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.journalMicroelectronics Reliabilityen_US
bordeaux.page113936en_US
bordeaux.volume114en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.peerReviewedouien_US
bordeaux.inpressnonen_US
bordeaux.identifier.funderIDAgence de l'innovation de Défenseen_US
bordeaux.identifier.funderIDDirection Générale de l’Armementen_US
bordeaux.import.sourcedissemin
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exportfalse
workflow.import.sourcedissemin
dc.rights.ccCC BY-NCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2020-11-01&rft.volume=114&rft.spage=113936&rft.epage=113936&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=CUROS,%20Laurine&DUBOIS,%20Tristan&MEJECAZE,%20G.&PUYBARET,%20F.&PLANO,%20Bernard&rft.genre=article


Fichier(s) constituant ce document

Thumbnail
Thumbnail

Ce document figure dans la(les) collection(s) suivante(s)

Afficher la notice abrégée