Detection, Characterization and Modeling of Localized Defects and Thermal Breakdown in Photovoltaic Panels from Thermal Images and IV Curves
| dc.rights.license | open | en_US |
| dc.contributor.author | AZKONA, Nekane | |
| hal.structure.identifier | ESTIA INSTITUTE OF TECHNOLOGY | |
| dc.contributor.author | LLARIA, Alvaro
ORCID: 0000-0002-0348-6419 IDREF: 259161004 | |
| hal.structure.identifier | ESTIA INSTITUTE OF TECHNOLOGY | |
| dc.contributor.author | CUREA, Octavian
ORCID: 0000-0002-5030-2088 IDREF: 68259131 | |
| dc.contributor.author | RECART, Federico | |
| dc.date.accessioned | 2023-04-04T09:39:46Z | |
| dc.date.available | 2023-04-04T09:39:46Z | |
| dc.date.issued | 2022-04-01 | |
| dc.identifier.issn | 2673-3978 | en_US |
| dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/172716 | |
| dc.description.abstractEn | In this work, a defective commercial module with a rounded IV characteristic is analyzed in detail to identify the sources of its malfunction. The analysis of the module includes thermography images taken under diverse conditions, the IV response of the module obtained without any shadow, and shadowing one cell at a time, as recommended by the IEC 61215 Standard. Additionally, a direct measurement of the IV characteristic and resistance of single cells in the panel has been conducted to verify the isolation between the p and n areas. In parallel, theoretical cell and module behaviors are presented. In this frame, simulations show how cell mismatch can be the explanation to the rounded IV output of the solar panel under study. From the thermal images of the module, several localized hot spots related to failing cells have been revealed. During the present study, thermal breakdown is seen before avalanche breakdown in one of the cells, evidencing a hot spot. Not many papers have dealt with this problem, whereas we believe it is important to analyze the relationship between thermal breakdown and hot spotting in order to prevent it in the future, since hot spots are the main defects related to degradation of modern modules. | |
| dc.language.iso | EN | en_US |
| dc.rights | Attribution 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/us/ | * |
| dc.subject.en | Photovoltaic panel | |
| dc.subject.en | Characterization | |
| dc.subject.en | Thermography | |
| dc.subject.en | Circuit model | |
| dc.subject.en | Hot spot | |
| dc.subject.en | Thermal breakdown | |
| dc.title.en | Detection, Characterization and Modeling of Localized Defects and Thermal Breakdown in Photovoltaic Panels from Thermal Images and IV Curves | |
| dc.type | Article de revue | en_US |
| dc.identifier.doi | 10.3390/electronicmat3020014 | en_US |
| dc.subject.hal | Sciences de l'ingénieur [physics]/Electronique | en_US |
| dc.subject.hal | Sciences de l'ingénieur [physics]/Matériaux | en_US |
| bordeaux.journal | Electronic Materials | en_US |
| bordeaux.page | 154-172 | en_US |
| bordeaux.volume | 3 | en_US |
| bordeaux.hal.laboratories | ESTIA - Recherche | en_US |
| bordeaux.issue | 2 | en_US |
| bordeaux.institution | Université de Bordeaux | en_US |
| bordeaux.institution | Bordeaux INP | en_US |
| bordeaux.institution | Bordeaux Sciences Agro | en_US |
| bordeaux.peerReviewed | oui | en_US |
| bordeaux.inpress | non | en_US |
| bordeaux.import.source | hal | |
| hal.identifier | hal-03655133 | |
| hal.version | 1 | |
| hal.export | false | |
| workflow.import.source | hal | |
| dc.rights.cc | Pas de Licence CC | en_US |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Electronic%20Materials&rft.date=2022-04-01&rft.volume=3&rft.issue=2&rft.spage=154-172&rft.epage=154-172&rft.eissn=2673-3978&rft.issn=2673-3978&rft.au=AZKONA,%20Nekane&LLARIA,%20Alvaro&CUREA,%20Octavian&RECART,%20Federico&rft.genre=article |
