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High-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification

hal.structure.identifierINL - Nanophotonique [INL - Photonique]
dc.contributor.authorBERGUIGA, L.
hal.structure.identifierINL - Nanophotonique [INL - Photonique]
dc.contributor.authorOROBTCHOUK, R.
hal.structure.identifierChimie et Biologie des Membranes et des Nanoobjets [CBMN]
dc.contributor.authorELEZGARAY, J.
hal.structure.identifierLaboratoire de Physique de l'ENS Lyon [Phys-ENS]
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorARNEODO, Alain
hal.structure.identifierLaboratoire de Physique de l'ENS Lyon [Phys-ENS]
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorARGOUL, Françoise
dc.date.created2017-05-01
dc.date.issued2017-06-27
dc.identifier.issn0146-9592
dc.description.abstractEnWe report on a high-resolution metal-clad waveguide scanning microscopic method with a diffraction-limited resolution. This microscope can be operated in both TM and TE waveguide modes with radially and azimuthally polarized beams, respectively, and allows both refractive index and topography of dielectric objects to be evaluated at high resolution and sensitivity. We emphasize the performance of this microscopic method from calibrated 3D polymer microstructures with rectangular, disk, and ring shapes.
dc.description.sponsorshipPROJET AVENIR LYON SAINT-ETIENNE - ANR-11-IDEX-0007
dc.language.isoen
dc.publisherOptical Society of America - OSA Publishing
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/
dc.title.enHigh-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification
dc.typeArticle de revue
dc.identifier.doi10.1364/OL.42.002523
dc.subject.halPhysique [physics]/Physique [physics]/Optique [physics.optics]
bordeaux.journalOptics Letters
bordeaux.page2523 - 2526
bordeaux.volume42
bordeaux.issue13
bordeaux.peerReviewedoui
hal.identifierhal-01548509
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01548509v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Optics%20Letters&rft.date=2017-06-27&rft.volume=42&rft.issue=13&rft.spage=2523%20-%202526&rft.epage=2523%20-%202526&rft.eissn=0146-9592&rft.issn=0146-9592&rft.au=BERGUIGA,%20L.&OROBTCHOUK,%20R.&ELEZGARAY,%20J.&ARNEODO,%20Alain&ARGOUL,%20Fran%C3%A7oise&rft.genre=article


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