High-resolution-scanning waveguide microscopy: spatial refractive index and topography quantification
ARNEODO, Alain
Laboratoire de Physique de l'ENS Lyon [Phys-ENS]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Laboratoire de Physique de l'ENS Lyon [Phys-ENS]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
ARGOUL, Françoise
Laboratoire de Physique de l'ENS Lyon [Phys-ENS]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
< Reduce
Laboratoire de Physique de l'ENS Lyon [Phys-ENS]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Language
en
Article de revue
This item was published in
Optics Letters. 2017-06-27, vol. 42, n° 13, p. 2523 - 2526
Optical Society of America - OSA Publishing
English Abstract
We report on a high-resolution metal-clad waveguide scanning microscopic method with a diffraction-limited resolution. This microscope can be operated in both TM and TE waveguide modes with radially and azimuthally polarized ...Read more >
We report on a high-resolution metal-clad waveguide scanning microscopic method with a diffraction-limited resolution. This microscope can be operated in both TM and TE waveguide modes with radially and azimuthally polarized beams, respectively, and allows both refractive index and topography of dielectric objects to be evaluated at high resolution and sensitivity. We emphasize the performance of this microscopic method from calibrated 3D polymer microstructures with rectangular, disk, and ring shapes.Read less <
ANR Project
PROJET AVENIR LYON SAINT-ETIENNE - ANR-11-IDEX-0007
Origin
Hal imported