Modelling and experimental study of heat deposition and transport in a semiconductor laser diode
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | LEWIS, D. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | PHAN, T. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | QUINTARD, V. | |
| hal.structure.identifier | Alcatel Alsthom Recherche | |
| dc.contributor.author | HORNUNG, V. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| dc.date.issued | 1998-04 | |
| dc.identifier.issn | 0026-2714 | |
| dc.description.abstractEn | An analytical model of heat transport in a laser diode is presented together with measurements of the temperature distribution by photothermal microscopy. Comparison between model and measurements shows the temperature distribution to be issued from a cylindrical heat source diffusing in the surrounding bulk material. Laser output facet heating by stimulated photon absorption is shown to be of negligible importance. | |
| dc.language.iso | en | |
| dc.publisher | Elsevier | |
| dc.title.en | Modelling and experimental study of heat deposition and transport in a semiconductor laser diode | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1016/s0026-2692(97)00055-4 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.journal | Microelectronics Reliability | |
| bordeaux.page | 171-179 | |
| bordeaux.volume | 29 | |
| bordeaux.issue | 4-5 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01550222 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550222v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=1998-04&rft.volume=29&rft.issue=4-5&rft.spage=171-179&rft.epage=171-179&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=LEWIS,%20D.&DILHAIRE,%20S.&PHAN,%20T.&QUINTARD,%20V.&HORNUNG,%20V.&rft.genre=article |
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