dc.contributor.author	LECOURT, B.
hal.structure.identifier	Centre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.author	BLAUDEZ, D.
hal.structure.identifier	Centre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.author	TURLET, J. M.
dc.date.issued	1998
dc.identifier.issn	0740-3232
dc.description.abstractEn	no abstract
dc.language.iso	en
dc.publisher	Optical Society of America
dc.title.en	Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir-Blodgett ultrathin films
dc.type	Article de revue
dc.subject.hal	Physique [physics]
bordeaux.journal	Journal of the Optical Society of America. A, Optics and image science
bordeaux.page	2769-2782
bordeaux.volume	15
bordeaux.issue	10
bordeaux.peerReviewed	oui
hal.identifier	hal-01550236
hal.version	1
hal.popular	non
hal.audience	Internationale
hal.origin.link	https://hal.archives-ouvertes.fr//hal-01550236v1
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Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir-Blodgett ultrathin films