Fault localisation in ICs by goniometric laser probing of thermal induced surface waves
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | ALTET, J. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | JOREZ, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | SCHAUB, Emmanuel | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | RUBIO, A. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| dc.date.issued | 1999-06 | |
| dc.identifier.issn | 0026-2714 | |
| dc.description.abstractEn | New methods for fault detection in ICs are needed due to new technological trends. The detection of heat generated by faults offers interesting perspectives in this respect. Periodic heat released at the surface or inside ICs generates a surface thermal wave that can be detected by appropriate laser probing at distances up to 500 μm from the source. We propose in this paper a goniometric laser probing method allowing the determination of the direction and distance of a fault with respect to the probing point. | |
| dc.language.iso | en | |
| dc.publisher | Elsevier | |
| dc.title.en | Fault localisation in ICs by goniometric laser probing of thermal induced surface waves | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1016/S0026-2714(99)00123-7 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.journal | Microelectronics Reliability | |
| bordeaux.page | 919-923 | |
| bordeaux.volume | 39 | |
| bordeaux.issue | 6-7 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01550429 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550429v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=1999-06&rft.volume=39&rft.issue=6-7&rft.spage=919-923&rft.epage=919-923&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=DILHAIRE,%20S.&ALTET,%20J.&JOREZ,%20S.&SCHAUB,%20Emmanuel&RUBIO,%20A.&rft.genre=article |
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