Mostrar el registro sencillo del ítem
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | LOPEZ, L. D. P. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | GRAUBY, Stéphane | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | DILHAIRE, S. | |
dc.contributor.author | SALHI, M. A. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | CLAEYS, W. | |
hal.structure.identifier | Laboratoire d'études thermiques [LET] | |
dc.contributor.author | LEFEVRE, S. | |
hal.structure.identifier | Laboratoire d'études thermiques [LET] | |
dc.contributor.author | VOLZ, S. | |
dc.date.issued | 2004-10 | |
dc.identifier.issn | 0026-2692 | |
dc.description.abstractEn | In this paper, we present the temperature profile measurements of a PN thermoelectric couple. The study is made in the AC regime. A couple is fed by a sinusoidal current and, using a scanning thermal microscope (SThM) and a lock-in scheme, we measure the amplitude and the phase of the first harmonic of the temperature along the surface of the couple. The influence of frequency is observed and we present a model which predicts the thermal behavior of the couple. The results of this model are in excellent agreement with the measurements. | |
dc.language.iso | en | |
dc.publisher | Elsevier | |
dc.subject.en | Thermal properties identification | |
dc.subject.en | Atomic force microscopy | |
dc.subject.en | Thermoelectric device | |
dc.title.en | Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope | |
dc.type | Article de revue | |
dc.identifier.doi | 10.1016/j.mejo.2004.06.010 | |
dc.subject.hal | Physique [physics] | |
bordeaux.journal | Microelectronics Journal | |
bordeaux.page | 797-803 | |
bordeaux.volume | 35 | |
bordeaux.issue | 10 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-01550876 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550876v1 | |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Journal&rft.date=2004-10&rft.volume=35&rft.issue=10&rft.spage=797-803&rft.epage=797-803&rft.eissn=0026-2692&rft.issn=0026-2692&rft.au=LOPEZ,%20L.%20D.%20P.&GRAUBY,%20St%C3%A9phane&DILHAIRE,%20S.&SALHI,%20M.%20A.&CLAEYS,%20W.&rft.genre=article |
Archivos en el ítem
Archivos | Tamaño | Formato | Ver |
---|---|---|---|
No hay archivos asociados a este ítem. |