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dc.contributor.authorSHOVKUN, D. V.
dc.contributor.authorTRUNIN, M. R.
dc.contributor.authorZHUKOV, A. A.
dc.contributor.authorNEFYODOV, Y. A.
hal.structure.identifierLaboratoire Pierre Aigrain [LPA]
dc.contributor.authorBONTEMPS, N.
hal.structure.identifierLaboratoire Pierre Aigrain [LPA]
dc.contributor.authorENRIQUEZ, H.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorBUZDIN, Alexandre I.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDAUMENS, M.
dc.contributor.authorTAMEGAI, T.
dc.date.issued2000
dc.identifier.issn0021-3640
dc.description.abstractEnno abstract
dc.language.isoen
dc.publisherSpringer Verlag
dc.title.enc-axis penetration depth in Bi2Sr2CaCu2O8+delta single crystals measured by ac-susceptibility and cavity perturbation technique
dc.typeArticle de revue
dc.identifier.doi10.1134/1.568288
dc.subject.halPhysique [physics]
bordeaux.journalJETP Letters
bordeaux.page92-96
bordeaux.volume71
bordeaux.issue2
bordeaux.peerReviewedoui
hal.identifierhal-01565314
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01565314v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=JETP%20Letters&rft.date=2000&rft.volume=71&rft.issue=2&rft.spage=92-96&rft.epage=92-96&rft.eissn=0021-3640&rft.issn=0021-3640&rft.au=SHOVKUN,%20D.%20V.&TRUNIN,%20M.%20R.&ZHUKOV,%20A.%20A.&NEFYODOV,%20Y.%20A.&BONTEMPS,%20N.&rft.genre=article


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