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Sensing temperature in CMOS circuits for thermal testing
hal.structure.identifier | Electronic Engineering Department | |
dc.contributor.author | ALTET, J. | |
dc.contributor.author | RUBIO, A. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | SALHI, A. | |
dc.contributor.author | GALVEZ, J. L. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | DILHAIRE, Stefan | |
dc.contributor.author | SYAL, A. | |
hal.structure.identifier | Institut Laue-Langevin [ILL] | |
dc.contributor.author | IVANOV, A. | |
dc.date.issued | 2004 | |
dc.identifier.isbn | 0-7695-2134-7 | |
dc.language.iso | en | |
dc.source.title | 22nd Ieee Vlsi Test Symposium, Proceedings | |
dc.title.en | Sensing temperature in CMOS circuits for thermal testing | |
dc.type | Chapitre d'ouvrage | |
dc.identifier.doi | 10.1109/vtest.2004.1299241 | |
dc.subject.hal | Physique [physics] | |
bordeaux.page | 179-184 | |
bordeaux.title.proceeding | 22nd Ieee Vlsi Test Symposium, Proceedings | |
hal.identifier | hal-01840910 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01840910v1 | |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.btitle=22nd%20Ieee%20Vlsi%20Test%20Symposium,%20Proceedings&rft.date=2004&rft.spage=179-184&rft.epage=179-184&rft.au=ALTET,%20J.&RUBIO,%20A.&SALHI,%20A.&GALVEZ,%20J.%20L.&DILHAIRE,%20Stefan&rft.isbn=0-7695-2134-7&rft.genre=unknown |
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