Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
| hal.structure.identifier | Laboratoire de Spectroscopie en Lumière Polarisée [LSLP] | |
| dc.contributor.author | TESSIER, G. | |
| hal.structure.identifier | Laboratoire de Spectroscopie en Lumière Polarisée [LSLP] | |
| dc.contributor.author | PAVAGEAU, S. | |
| hal.structure.identifier | Laboratoire de Spectroscopie en Lumière Polarisée [LSLP] | |
| dc.contributor.author | FILLOY, C. | |
| hal.structure.identifier | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés [TIMA] | |
| dc.contributor.author | CHARLOT, B. | |
| hal.structure.identifier | Laboratoire de Spectroscopie en Lumière Polarisée [LSLP] | |
| dc.contributor.author | JEROSOLIMSKI, G. | |
| hal.structure.identifier | Laboratoire de Spectroscopie en Lumière Polarisée [LSLP] | |
| dc.contributor.author | FOURNIER, D. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | CRETIN, B. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | GOMES, S. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | TRANNOY, N. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | VAIRAC, P. | |
| hal.structure.identifier | Micro et nanothermique [MN] | |
| dc.contributor.author | VOLZ, S. | |
| dc.date.created | 2005-09 | |
| dc.date.issued | 2005-09 | |
| dc.date.conference | 2005-09 | |
| dc.description.abstractEn | We have developed a CCD-based thermoreflectance microscope which can deliver thermal images of working integrated circuits. | |
| dc.language.iso | en | |
| dc.publisher | TIMA Editions | |
| dc.source.title | International Worshop on THERMal INvestigations of ICs and Systems | |
| dc.subject.en | Thermoreflectance | |
| dc.subject.en | thermal mapping | |
| dc.title.en | Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit | |
| dc.type | Communication dans un congrès | |
| dc.subject.hal | Informatique [cs]/Architectures Matérielles [cs.AR] | |
| bordeaux.page | 290-293 | |
| bordeaux.conference.title | THERMINIC 2005 | |
| bordeaux.country | IT | |
| bordeaux.title.proceeding | International Worshop on THERMal INvestigations of ICs and Systems | |
| bordeaux.conference.city | Belgirate, Lago Maggiore | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-00189488 | |
| hal.version | 1 | |
| hal.invited | non | |
| hal.proceedings | oui | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-00189488v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.btitle=International%20Worshop%20on%20THERMal%20INvestigations%20of%20ICs%20and%20Systems&rft.date=2005-09&rft.spage=290-293&rft.epage=290-293&rft.au=TESSIER,%20G.&PAVAGEAU,%20S.&FILLOY,%20C.&CHARLOT,%20B.&JEROSOLIMSKI,%20G.&rft.genre=unknown |
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