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Influence of a rough thin layer on the potential

hal.structure.identifierInstitut Camille Jordan [ICJ]
dc.contributor.authorCIUPERCA, Ionel
hal.structure.identifierAmpère [AMPERE]
dc.contributor.authorPERRUSSEL, Ronan
hal.structure.identifierModélisation, contrôle et calcul [MC2]
dc.contributor.authorPOIGNARD, Clair
dc.date.created2009
dc.date.issued2009-11
dc.date.conference2009-11-22
dc.description.abstractEnIn this paper, we study the behavior of the steadystate voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer is supposed to be "–periodic, " being the small thickness of the layer. We present and validate numerically the rigorous approximate transmissions proved by Ciuperca et al. in [http://hal.inria.fr/inria-00356124/fr/]. This paper extends previous works in which the layer had a constant thickness
dc.language.isoen
dc.source.titleProceedings of the 17th IEEE Conference on the Computation of Electromagnetic Fields
dc.title.enInfluence of a rough thin layer on the potential
dc.typeCommunication dans un congrès avec actes
dc.subject.halSciences de l'ingénieur [physics]/Energie électrique
dc.subject.halInformatique [cs]/Modélisation et simulation
bordeaux.pageà paraître
bordeaux.countryBR
bordeaux.title.proceedingCompumag 2009
bordeaux.conference.cityFlorianópolis
bordeaux.peerReviewedoui
hal.identifierhal-00412388
hal.version1
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00412388v1
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