Thickness determination in anisotropic media with plasmon waveguide resonance imaging
| hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
| dc.contributor.author | HARTÉ, Etienne | |
| hal.structure.identifier | Chimie et Biologie des Membranes et des Nanoobjets [CBMN] | |
| dc.contributor.author | ALVES, Isabel | |
| hal.structure.identifier | Laboratoire Photonique, Numérique et Nanosciences [LP2N] | |
| dc.contributor.author | IHRKE, Ivo | |
| hal.structure.identifier | Chimie et Biologie des Membranes et des Nanoobjets [CBMN] | |
| dc.contributor.author | ELEZGARAY, Juan | |
| dc.date.issued | 2019-02-04 | |
| dc.identifier.issn | 1094-4087 | |
| dc.description.abstractEn | This paper describes a simple procedure to determine the local thickness of a thin anisotropic layer. It also discriminates between isotropic and anisotropic regions, provided a smoothness hypothesis on the refractive index distribution is satisfied. The procedure is based on the analysis of surface plasmon resonance (SPR) data acquired in an imaging mode. The general arrangement of the setup is the Kretschmann configuration. We show, on an azobenzene modified polymer layer, good agreement between atomic force microscopy and optical measurements of thickness variation. | |
| dc.language.iso | en | |
| dc.publisher | Optical Society of America - OSA Publishing | |
| dc.title.en | Thickness determination in anisotropic media with plasmon waveguide resonance imaging | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1364/OE.27.003264 | |
| dc.subject.hal | Sciences de l'ingénieur [physics]/Optique / photonique | |
| bordeaux.journal | Optics Express | |
| bordeaux.page | 3264-3275 | |
| bordeaux.volume | 27 | |
| bordeaux.issue | 3 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-02010368 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-02010368v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Optics%20Express&rft.date=2019-02-04&rft.volume=27&rft.issue=3&rft.spage=3264-3275&rft.epage=3264-3275&rft.eissn=1094-4087&rft.issn=1094-4087&rft.au=HART%C3%89,%20Etienne&ALVES,%20Isabel&IHRKE,%20Ivo&ELEZGARAY,%20Juan&rft.genre=article |
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