Thermal exchange radius measurement: Application to nanowire thermal imaging
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
hal.structure.identifier | Laboratoire des Composants pour la Récupération d'Énergies [LCRE] | |
dc.contributor.author | PUYOO, Etienne | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | GRAUBY, Stéphane | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | RAMPNOUX, Jean-Michel | |
hal.structure.identifier | Laboratoire des Composants pour la Récupération d'Énergies [LCRE] | |
hal.structure.identifier | Laboratoire Composants Hybrides [LCH] | |
dc.contributor.author | ROUVIÈRE, Emmanuelle | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | DILHAIRE, Stefan | |
dc.date.created | 2010-03-26 | |
dc.date.issued | 2010-07-02 | |
dc.identifier.issn | 0034-6748 | |
dc.description.abstractEn | In scanning thermal microscopy (SThM) techniques, the thermal exchange radius between tip and sample is a crucial parameter. Indeed, it limits the lateral spatial resolution but, in addition, an accurate value of this parameter is necessary for a precise identification of thermal properties. But until now, the thermal exchange radius is usually estimated but not measured. This paper presents an experimental procedure, based on the 3ω-SThM method, to measure its value. We apply this procedure to evaluate the thermal exchange radius of two commercial probes: the well-known Wollaston one and a new probe constituted of a palladium film on a SiO2 substrate. Finally, presenting silicon nanowire images, we clearly demonstrate that this new probe can reach a spatial resolution better than 100 nm whereas the Wollaston probe hardly reaches a submicronic spatial resolution. | |
dc.language.iso | en | |
dc.publisher | American Institute of Physics | |
dc.title.en | Thermal exchange radius measurement: Application to nanowire thermal imaging | |
dc.type | Article de revue | |
dc.identifier.doi | 10.1063/1.3455214 | |
bordeaux.journal | Review of Scientific Instruments | |
bordeaux.page | 073701 (1-5) | |
bordeaux.volume | 81 | |
bordeaux.issue | 7 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-00505488 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-00505488v1 | |
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