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Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring

hal.structure.identifierElectronic Engineering Department
dc.contributor.authorALTET, Josep
hal.structure.identifierElectronic Engineering Department
dc.contributor.authorMATEO, Diego
hal.structure.identifierCentre Nacional de Microelectrònica [CNM]
dc.contributor.authorPERPINYA, Xavier
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorGRAUBY, Stéphane
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorDILHAIRE, Stefan
hal.structure.identifierCentre Nacional de Microelectrònica [CNM]
dc.contributor.authorJORDÀ, Xavier
dc.date.created2011-06-14
dc.date.issued2011-09
dc.identifier.issn0034-6748
dc.description.abstractEnThis work presents an alternative characterization strategy to quantify the nonlinear behavior of temperature sensing systems. The proposed approach relies on measuring the temperature under thermal sinusoidal steady state and observing the intermodulation products that are generated within the sensing system itself due to its nonlinear temperature-output voltage characteristics. From such intermodulation products, second-order interception points can be calculated as a figure of merit of the measuring system nonlinear behavior. In this scenario, the present work first shows a theoretical analysis. Second, it reports the experimental results obtained with three thermal sensing techniques used in integrated circuits.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.title.enNonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring
dc.typeArticle de revue
dc.identifier.doi10.1063/1.3633957
bordeaux.journalReview of Scientific Instruments
bordeaux.page094902 (4)
bordeaux.volume82
bordeaux.peerReviewedoui
hal.identifierhal-00635099
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00635099v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.date=2011-09&rft.volume=82&rft.spage=094902%20(4)&rft.epage=094902%20(4)&rft.eissn=0034-6748&rft.issn=0034-6748&rft.au=ALTET,%20Josep&MATEO,%20Diego&PERPINYA,%20Xavier&GRAUBY,%20St%C3%A9phane&DILHAIRE,%20Stefan&rft.genre=article


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