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hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorBUCHOUX, Julien
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorAIMÉ, Jean-Pierre
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorBOISGARD, Rodolphe
hal.structure.identifierELORET corporation
dc.contributor.authorNGUYEN, Cattien V
hal.structure.identifierInstitut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
dc.contributor.authorBUCHAILLOT, Lionel
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorMARSAUDON, Sophie
dc.date.created2009-05-19
dc.date.issued2009-10-26
dc.identifier.issn0957-4484
dc.description.abstractEnMechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.
dc.language.isoen
dc.publisherInstitute of Physics
dc.title.enInvestigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact
dc.typeArticle de revue
dc.identifier.doi10.1088/0957-4484/20/47/475701
bordeaux.journalNanotechnology
bordeaux.page475701 (1-8)
bordeaux.volume20
bordeaux.issue47
bordeaux.peerReviewedoui
hal.identifierhal-00669678
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00669678v1
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