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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorHEINTZ, Jean-Marc
hal.structure.identifierTemex Ceramics
dc.contributor.authorDUGUEY, Sonia
hal.structure.identifierThales Research and Technology [Palaiseau]
dc.contributor.authorLEBOURGEOIS, Richard
hal.structure.identifierThales Research and Technology [Palaiseau]
dc.contributor.authorGANNE, Jean-Pierre
dc.date.issued2007
dc.identifier.issn0955-2219
dc.description.abstractEnThe objective of this paper was to determine the dielectric properties of AgNb1/2Ta1/2O3 (referenced ANT22) sintered at low temperature without any addition or substitution. Hot-pressing was performed to decrease the sintering temperature. By this way, high density were achieved. The resulting samples were compared with conventionally sintered ANT22 and with copper oxide added ANT22. The highest densities were obtained for the hot-pressed samples compared with the CuO added ones. We concluded that the dielectric losses of the hot-pressed and copper oxide added ANT22 were very similar at high frequency (f > 1 MHz), indicating that copper oxide does not degrade the ANT22 properties. Conversely, low frequency dielectric properties were different, with a strong dielectric relaxation for the hot-pressed samples.
dc.language.isoen
dc.publisherElsevier
dc.subject.enHot-pressing
dc.subject.enDielectric properties
dc.subject.enPerovskites
dc.subject.enCapacitors
dc.subject.enANT
dc.title.enHigh frequency dielectric properties of hot-pressed Ag(NbxTa1−x)O3 solid solutions
dc.typeArticle de revue
dc.identifier.doi10.1016/j.jeurceramsoc.2006.05.018
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of the European Ceramic Society
bordeaux.page1087-1091
bordeaux.volume27 (2-3)
bordeaux.peerReviewedoui
hal.identifierhal-00124929
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00124929v1
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