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hal.structure.identifierInstitute of Materials Science and Applied Research
dc.contributor.authorSUDZIUS, Markas
hal.structure.identifierInstitute of Materials Science and Applied Research
dc.contributor.authorALEKSIEJUNAS, Ramunas
hal.structure.identifierInstitute of Materials Science and Applied Research
dc.contributor.authorJARAŠIUNAS, Kestutis
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorVERSTRAETEN, David
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLAUNAY, Jean-Claude
dc.date.issued2003
dc.description.abstractEnWe present a novel way to determine the type of dominant carrier photoexcited from deep traps in a photorefractive semiconductor. A numerical analysis of a picosecond free-carrier grating dynamics has revealed an excitation intensity dependent grating diffusive decay time τD as well as effective carrier diffusion coefficient D, when the intensity varied in the range below that required to create a bipolar carrier plasma. According to the numerical analysis, an increase or decrease of effective diffusion coefficient D with excitation can be used as a criterion to distinguish the type of photogenerated carrier. We have verified this method experimentally by measuring dependences of effective D versus excitation density in a number of vanadium-doped and shallow-impurity codoped CdTe and ZnCdTe crystals, using for excitation a picosecond YAG:Nd laser (hν = 1.17 eV). The results were found to be in good agreement with predictions, based on carrier transport peculiarities in photorefractive crystals, and correlated well with the secondary ion mass spectroscopy data for each crystal.
dc.language.isoen
dc.subject.enElectric current carriers
dc.subject.enDeep traps
dc.subject.enDopants
dc.subject.enFour wave mixing
dc.subject.enSimulation and Modeling
dc.subject.enPhotorefractive effect
dc.subject.enArsenic
dc.subject.enVanadium
dc.title.enInvestigation of nonequilibrium carrier transport in vanadium-doped CdTe and CdZnTe crystals using the time-resolved four-wave mixing technique
dc.typeArticle de revue
dc.identifier.doi10.1088/0268-1242/18/4/330
dc.subject.halChimie/Matériaux
bordeaux.journalSemiconductor Science & Technology
bordeaux.page367-376
bordeaux.volume18
bordeaux.issue4
bordeaux.peerReviewedoui
hal.identifierhal-00258374
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00258374v1
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