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Fractional Behaviours Modelling with Volterra Equations: Application to a Lithium-Ion Cell and Comparison with a Fractional Model
dc.rights.license | open | en_US |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | TARTAGLIONE, Vincent | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | FARGES, Christophe
IDREF: 115018204 | |
dc.contributor.author | SABATIER, Jocelyn
IDREF: 05934976X | |
dc.date.accessioned | 2022-07-12T14:28:41Z | |
dc.date.available | 2022-07-12T14:28:41Z | |
dc.date.issued | 2022-03 | |
dc.identifier.uri | oai:crossref.org:10.3390/fractalfract6030137 | |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/140450 | |
dc.description.abstractEn | This paper proposes to model fractional behaviors using Volterra equations. As fractional differentiation-based models that are commonly used to model such behaviors exhibit several drawbacks and are particular cases of Volterra equations (in the kernel definition), it appears legitimate in a modeling approach to work directly with Volterra equations. In this paper, a numerical method is thus developed to identify the kernel associated to a Volterra equation that describes the input–output behavior of a system. This method is used to model a lithium-ion cell using real data. The resulting model is compared to a fractional differentiation-based model with the same number of tunable parameters. | |
dc.language.iso | EN | en_US |
dc.source | crossref | |
dc.subject.en | fractional behaviours | |
dc.subject.en | fractional models | |
dc.subject.en | Volterra equations | |
dc.subject.en | lithium-ion cell | |
dc.title.en | Fractional Behaviours Modelling with Volterra Equations: Application to a Lithium-Ion Cell and Comparison with a Fractional Model | |
dc.type | Article de revue | en_US |
dc.identifier.doi | 10.3390/fractalfract6030137 | en_US |
dc.subject.hal | Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique | en_US |
bordeaux.journal | Fractal and Fractional | en_US |
bordeaux.page | 137 | en_US |
bordeaux.volume | 6 | en_US |
bordeaux.hal.laboratories | Laboratoire d’Intégration du Matériau au Système (IMS) - UMR 5218 | en_US |
bordeaux.issue | 3 | en_US |
bordeaux.institution | Université de Bordeaux | en_US |
bordeaux.institution | Bordeaux INP | en_US |
bordeaux.institution | CNRS | en_US |
bordeaux.peerReviewed | oui | en_US |
bordeaux.inpress | non | en_US |
bordeaux.import.source | dissemin | |
hal.identifier | hal-03721452 | |
hal.version | 1 | |
hal.date.transferred | 2022-07-12T14:28:44Z | |
hal.export | true | |
workflow.import.source | dissemin | |
dc.rights.cc | Pas de Licence CC | en_US |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Fractal%20and%20Fractional&rft.date=2022-03&rft.volume=6&rft.issue=3&rft.spage=137&rft.epage=137&rft.au=TARTAGLIONE,%20Vincent&FARGES,%20Christophe&SABATIER,%20Jocelyn&rft.genre=article |