Recherche
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Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
(Microelectronics Reliability. vol. 39, pp. 1, 1999)Article de revue -
Low Power Frequency Dividers using TSPC logic in 28nm FDSOI Technology
Communication dans un congrès -
A 40 GHz Varactor-less Class-C VCO with 17.1% Tuning Range and Long-Term Reliability in 28nm FD-SOI for Satellite Communications
Communication dans un congrès