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Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection

dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorCUROS, Laurine
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDUBOIS, Tristan
IDREF: 139527613
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorMEJECAZE, Guillaume
dc.contributor.authorPUYBARET, Frederic
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorVINASSA, Jean-Michel
IDREF: 078898064
dc.date.accessioned2023-12-05T12:36:41Z
dc.date.available2023-12-05T12:36:41Z
dc.date.issued2020-04-16
dc.date.conference2020-02-26
dc.identifier.issn2473-2001en_US
dc.identifier.urioai:crossref.org:10.1109/icit45562.2020.9067183
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/186364
dc.description.abstractEnThis paper presents a model able to reproduce the behavior of switch-mode power supply (SMPS) under a high-level current pulse injected at its input. In fact, such injected current involves particular phenomena that component models manufacturer have not been considered. To improve the SMPS model, some components particular behaviors have to be analyzed. Saturation phenomena in common mode chokes and rectifier bridge reverse recovery are especially considered by modelling. These phenomena have been modelled thanks to current and impedance measurements and integrated in an electronic simulation software. Finally, common mode chokes and rectifier bridge new models improve simulation results in accordance with measurement.
dc.language.isoENen_US
dc.publisherIEEEen_US
dc.sourcecrossref
dc.subjectInductors
dc.subjectSwitched mode power supplies
dc.subjectCurrent measurement
dc.subjectRectifiers
dc.subjectIntegrated circuit modeling
dc.subjectBridge circuits
dc.subjectSwitches
dc.subjectBridge circuits
dc.subjectCircuit simulation
dc.subjectElectric impedance measurement
dc.subjectInductors
dc.subjectRectifiers
dc.subjectSwitched mode power supplies
dc.subjectSusceptibility
dc.subjectSwitch-mode power supply
dc.subjectCommon mode choke saturation
dc.subjectRectifier bridge reverse recovery modelling
dc.subjectIEMI
dc.title.enSusceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection
dc.typeCommunication dans un congrèsen_US
dc.identifier.doi10.1109/icit45562.2020.9067183en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.page511-516en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.titleIEEE International Conference on Industrial Technology (ICIT), 26-28 Feb. 2020, Buenos Aires (Argentina)en_US
bordeaux.countryaren_US
bordeaux.title.proceeding2020 IEEE International Conference on Industrial Technology (ICIT)en_US
bordeaux.teamRELIABILITYen_US
bordeaux.conference.cityBuenos Airesen_US
bordeaux.import.sourcedissemin
hal.identifierhal-04323610
hal.version1
hal.date.transferred2023-12-05T12:36:43Z
hal.invitedouien_US
hal.proceedingsouien_US
hal.conference.end2020-02-28
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exporttrue
workflow.import.sourcedissemin
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2020-04-16&rft.spage=511-516&rft.epage=511-516&rft.eissn=2473-2001&rft.issn=2473-2001&rft.au=CUROS,%20Laurine&DUBOIS,%20Tristan&MEJECAZE,%20Guillaume&PUYBARET,%20Frederic&VINASSA,%20Jean-Michel&rft.genre=unknown


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