Tests non destructifs térahertz basés sur une source de corps noir avec réalité augmentée
dc.rights.license | open | en_US |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | GUILLET, Jean Paul
ORCID: 0000-0003-4434-8052 IDREF: 151192669 | |
dc.contributor.author | RIOULT, Jean | |
dc.contributor.author | GAQUIERE, Christophe | |
dc.date.accessioned | 2023-10-19T12:27:11Z | |
dc.date.available | 2023-10-19T12:27:11Z | |
dc.date.issued | 2023 | |
dc.date.conference | 2023-08-20 | |
dc.identifier.uri | oai:crossref.org:10.1117/12.2681926 | |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/184488 | |
dc.description.abstract | We present original work on non-destructive testing with an imaging solution combining a sensor that can measure the millimeter-wave radiation of a black body at temperatures between 290-400°K and a portable solution based on augmented reality with a smartphone. This handy portable solution makes it possible to do away with mechanical scanning systems which are heavy and slow, and therefore may be suitable for civil engineering detection or imaging applications, or in the field of aeronautics. | |
dc.language.iso | EN | en_US |
dc.publisher | SPIE | en_US |
dc.source | crossref | |
dc.subject | THz characterization passive imaging zero power blackbody source Augmented reality smartphone non destructive testing | |
dc.subject | Terahertz imaging | |
dc.subject | THz characterization | |
dc.subject | Passive imaging | |
dc.subject | Zero power | |
dc.subject | Blackbody source | |
dc.subject | Augmented reality | |
dc.subject | Smartphone | |
dc.subject | Non destructive testing | |
dc.subject | Terahertz applications | |
dc.title | Tests non destructifs térahertz basés sur une source de corps noir avec réalité augmentée | |
dc.title.en | Blackbody source-based terahertz nondestructive testing with augmented reality | |
dc.type | Communication dans un congrès | en_US |
dc.identifier.doi | 10.1117/12.2681926 | en_US |
dc.subject.hal | Sciences de l'ingénieur [physics]/Electromagnétisme | en_US |
bordeaux.institution | Université de Bordeaux | en_US |
bordeaux.institution | Bordeaux INP | en_US |
bordeaux.institution | CNRS | en_US |
bordeaux.conference.title | SPIE Optical Engineering + Applications, 2023 | en_US |
bordeaux.country | us | en_US |
bordeaux.title.proceeding | Proceedings Volume 12683, Terahertz Emitters, Receivers, and Applications XIV | en_US |
bordeaux.team | NANOELECTRONICS-LASER | en_US |
bordeaux.conference.city | San Diego | en_US |
bordeaux.import.source | dissemin | |
hal.invited | oui | en_US |
hal.proceedings | oui | en_US |
hal.conference.end | 2023-08-24 | |
hal.popular | non | en_US |
hal.audience | Internationale | en_US |
hal.export | false | |
workflow.import.source | dissemin | |
dc.rights.cc | Pas de Licence CC | en_US |
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