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Effects of EMC filter topologies on the destruction scenarios of SMPS under high current interference pulses

dc.rights.licenseopenen_US
dc.contributor.authorCUROS, Laurine
dc.contributor.authorMEJECAZE, Guillaume
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorDUBOIS, Tristan
IDREF: 139527613
dc.contributor.authorPUYBARET, Frederic
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorVINASSA, Jean-Michel
IDREF: 078898064
dc.date.accessioned2023-06-13T08:45:58Z
dc.date.available2023-06-13T08:45:58Z
dc.date.issued2022-10-05
dc.date.conference2022-09-05
dc.identifier.issn1803-7232en_US
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/182655
dc.description.abstractEnThis paper presents the effects of high amplitude conducted interference pulses on a switch mode power supply (SMPS). The interference injection is performed in differential mode and the interference amplitude is increased until the power supply destruction. These destruction tests are performed on different topologies of SMPS input filter. Then, all the destroyed SMPS components are analysed and measurements are performed to better understand the destruction mechanism. All this knowledge is finally used to build a behavioural model able to predict the destruction of the power supplies.
dc.language.isoENen_US
dc.subjectBridges
dc.subjectCurrent measurement
dc.subjectSwitched mode power supplies
dc.subjectRectifiers
dc.subjectInterference
dc.subjectSwitches
dc.subjectPulse width modulation
dc.subjectElectromagnetic compatibility
dc.subjectElectromagnetic interference
dc.subjectInterference suppression
dc.subjectSwitched mode power supplies
dc.subjectSusceptibility
dc.subjectSwitch-mode power supply
dc.subjectHEMP
dc.subjectNEMP
dc.subjectEMI filter
dc.title.enEffects of EMC filter topologies on the destruction scenarios of SMPS under high current interference pulses
dc.typeCommunication dans un congrès avec actesen_US
dc.identifier.doi10.1109/EMCEurope51680.2022.9901137en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.page295-298en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.title2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden, 2022en_US
bordeaux.countryseen_US
bordeaux.title.proceeding2022 International Symposium on Electromagnetic Compatibility – EMC Europeen_US
bordeaux.teamFIABILITE-PACEen_US
bordeaux.teamFIABILITE-PUISSANCEen_US
bordeaux.conference.cityGothenburgen_US
bordeaux.peerReviewedouien_US
hal.identifierhal-04126289
hal.version1
hal.date.transferred2023-06-13T08:46:08Z
hal.exporttrue
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2022-10-05&rft.spage=295-298&rft.epage=295-298&rft.eissn=1803-7232&rft.issn=1803-7232&rft.au=CUROS,%20Laurine&MEJECAZE,%20Guillaume&DUBOIS,%20Tristan&PUYBARET,%20Frederic&VINASSA,%20Jean-Michel&rft.genre=proceeding


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