A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction
| hal.structure.identifier | Models and Algorithms for Visualization and Rendering [MAVERICK ] | |
| dc.contributor.author | HOLZSCHUCH, Nicolas | |
| hal.structure.identifier | Laboratoire Photonique, Numérique et Nanosciences [LP2N] | |
| hal.structure.identifier | Melting the frontiers between Light, Shape and Matter [MANAO] | |
| dc.contributor.author | PACANOWSKI, Romain | |
| dc.date.accessioned | 2023-05-12T10:52:42Z | |
| dc.date.available | 2023-05-12T10:52:42Z | |
| dc.date.created | 2017-04-28 | |
| dc.date.issued | 2017-07-20 | |
| dc.identifier.issn | 0730-0301 | |
| dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/181868 | |
| dc.description.abstractEn | Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances. | |
| dc.description.sponsorship | Reproduction de textures d'objets d'art ancien à base de micro-géométrie - ANR-15-CE38-0005 | |
| dc.language.iso | en | |
| dc.publisher | Association for Computing Machinery | |
| dc.subject.en | diffraction | |
| dc.subject.en | material models | |
| dc.subject.en | CCS Concepts: Computing methodologies → Reflectance modeling | |
| dc.subject.en | BRDF | |
| dc.title.en | A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1145/3072959.3073621 | |
| dc.subject.hal | Informatique [cs]/Synthèse d'image et réalité virtuelle [cs.GR] | |
| bordeaux.journal | ACM Transactions on Graphics | |
| bordeaux.page | 12 | |
| bordeaux.volume | 36 | |
| bordeaux.hal.laboratories | Laboratoire Photonique, Numérique et Nanosciences (LP2N) - UMR 5298 | * |
| bordeaux.issue | 4 | |
| bordeaux.institution | Université de Bordeaux | |
| bordeaux.institution | CNRS | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01515948 | |
| hal.version | 1 | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01515948v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=ACM%20Transactions%20on%20Graphics&rft.date=2017-07-20&rft.volume=36&rft.issue=4&rft.spage=12&rft.epage=12&rft.eissn=0730-0301&rft.issn=0730-0301&rft.au=HOLZSCHUCH,%20Nicolas&PACANOWSKI,%20Romain&rft.genre=article |
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