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hal.structure.identifierÉnergie Matériaux Télécommunications - INRS [EMT-INRS]
dc.contributor.authorBRIZARD, Benoit
hal.structure.identifierLaboratoire d'optique appliquée [LOA]
dc.contributor.authorLEBLANC, Adrien
hal.structure.identifierCentre d'Etudes Lasers Intenses et Applications [CELIA]
dc.contributor.authorPETIT, Stephane
hal.structure.identifierCentre d'Etudes Lasers Intenses et Applications [CELIA]
dc.contributor.authorDELAGNES, Jean-Christop
hal.structure.identifierLaboratoire Photonique, Numérique et Nanosciences [LP2N]
dc.contributor.authorCORMIER, Éric
hal.structure.identifierÉnergie Matériaux Télécommunications - INRS [EMT-INRS]
dc.contributor.authorIBRAHIM, Heide
hal.structure.identifierÉnergie Matériaux Télécommunications - INRS [EMT-INRS]
dc.contributor.authorLÉGARÉ, François
hal.structure.identifierÉnergie Matériaux Télécommunications - INRS [EMT-INRS]
dc.contributor.authorLASSONDE, Philippe
dc.date.accessioned2023-05-12T10:37:58Z
dc.date.available2023-05-12T10:37:58Z
dc.date.issued2020-11-23
dc.identifier.issn1094-4087
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/181547
dc.description.abstractEnThe frequency-resolved optical switching (FROSt) method developed for ultrashort pulse characterization is implemented for single-shot measurements. In this basic demonstration, the delay axis of the spectrogram is spatially encoded by the pump beam having a small incident angle with the photoexcited material. We present the calibration procedure for spectrograms acquired in single-shot and the temporal characterization of 44 fs pulses with central wavelength at 800 nm both in scanning and single-shot FROSt configurations. The retrieved pulses are compared by means of the root-mean-square field error. Finally, the pulses are propagated through a known dispersive material to measure the added group-delay dispersion.
dc.language.isoen
dc.publisherOptical Society of America - OSA Publishing
dc.subject.enlaser
dc.subject.ennonlinear optics
dc.title.enSingle-shot phase-matching free ultrashort pulse characterization based on transient absorption in solids
dc.typeArticle de revue
dc.identifier.doi10.1364/OE.409342
dc.subject.halPhysique [physics]/Physique [physics]/Optique [physics.optics]
bordeaux.journalOptics Express
bordeaux.page35807
bordeaux.volume28
bordeaux.hal.laboratoriesLaboratoire Photonique, Numérique et Nanosciences (LP2N) - UMR 5298*
bordeaux.institutionUniversité de Bordeaux
bordeaux.institutionCNRS
bordeaux.peerReviewedoui
hal.identifierhal-03021345
hal.version1
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-03021345v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Optics%20Express&rft.date=2020-11-23&rft.volume=28&rft.spage=35807&rft.epage=35807&rft.eissn=1094-4087&rft.issn=1094-4087&rft.au=BRIZARD,%20Benoit&LEBLANC,%20Adrien&PETIT,%20Stephane&DELAGNES,%20Jean-Christop&CORMIER,%20%C3%89ric&rft.genre=article


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