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Frequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films

hal.structure.identifierJack Baskin School of Engineering [UCSC]
dc.contributor.authorPERNOT, Gilles
hal.structure.identifierJack Baskin School of Engineering [UCSC]
dc.contributor.authorMICHEL, Hélène
hal.structure.identifierJack Baskin School of Engineering [UCSC]
dc.contributor.authorVERMEERSCH, Bjorn
hal.structure.identifierMaterials Department
dc.contributor.authorBURKE, Peter
hal.structure.identifierMaterials Department
dc.contributor.authorLU, Hong
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorRAMPNOUX, Jean-Michel
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorDILHAIRE, Stefan
hal.structure.identifierInstitut Pprime [UPR 3346] [PPrime [Poitiers]]
dc.contributor.authorEZZAHRI, Younes
hal.structure.identifierMaterials Department
dc.contributor.authorGOSSARD, Arthur
hal.structure.identifierJack Baskin School of Engineering [UCSC]
dc.contributor.authorSHAKOURI, Ali
dc.date.issued2011-08-11
dc.date.conference2011-04-25
dc.description.abstractEnOver the past three decades, ultrashort laser pulses have been demonstrated to be a very powerful tool to investigate materials properties at the nanoscale. A key driving force is the high-time resolution required to study heat transfer across interfaces and in thin films. The Time-Domain Thermoreflectance (TDTR) is now widely used. This optical technique offers an interesting alternative to electrical approaches such as the 3ω method. We present a complete study of the TDTR signals. We investigate the influence of the modulation frequency on the measured signals and we show how this experimental parameter could be set to enhance or reduce the sensitivity to a specific thermal parameter. The dependence of the measured “apparent” thermal conductivity of the thin film as a function of the modulation frequency is discussed. Results are applied to investigate thermal properties of a series of InGaAs samples with embedded ErAs nanoparticles.
dc.language.isoen
dc.source.titleMRS Proceedings
dc.subject.enPump-probe Thermoreflectance
dc.subject.enBallistic-Diffusive Heat Transfer
dc.subject.enSemiconductor
dc.subject.enThermal Conductivity
dc.title.enFrequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films
dc.typeCommunication dans un congrès
dc.identifier.doi10.1557/opl.2011.1277
dc.subject.halPhysique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
bordeaux.pagemrss11-1347-bb07-07
bordeaux.volume1347
bordeaux.conference.titleMaterial Research Society Spring Meeting 2011
bordeaux.countryUS
bordeaux.title.proceedingMRS Proceedings
bordeaux.conference.citySan Francisco, CA
bordeaux.peerReviewedoui
hal.identifierhal-01537850
hal.version1
hal.invitednon
hal.proceedingsnon
hal.conference.end2011-04-29
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01537850v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.btitle=MRS%20Proceedings&rft.date=2011-08-11&rft.volume=1347&rft.spage=mrss11-1347-bb07-07&rft.epage=mrss11-1347-bb07-07&rft.au=PERNOT,%20Gilles&MICHEL,%20H%C3%A9l%C3%A8ne&VERMEERSCH,%20Bjorn&BURKE,%20Peter&LU,%20Hong&rft.genre=unknown


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