Differential thermal testing: An approach to its feasibility
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | ALTET, J. | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | RUBIO, A. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | SCHAUB, E. | |
| hal.structure.identifier | Department of Computer Science and Engineering [Akita] | |
| dc.contributor.author | TAMAMOTO, H. | |
| dc.date.issued | 1999-02 | |
| dc.identifier.issn | 0923-8174 | |
| dc.description.abstractEn | Testing techniques based on the functional behaviour, the propagation delay and the levels of quiescent current have been used with great success for the last two decade technologies. However, the efficiency of such techniques is dubious for future technologies, characterised by huge mixed-mode complex circuits and very low supply voltage levels. In this paper the feasibility of using internal thermal sensors to detect heat sources provoked by structural defects are considered and evaluated. | |
| dc.language.iso | en | |
| dc.publisher | Springer Verlag | |
| dc.title.en | Differential thermal testing: An approach to its feasibility | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1023/a:1008397205559 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.journal | Journal of Electronic Testing: : Theory and Applications | |
| bordeaux.page | 57-66 | |
| bordeaux.volume | 14 | |
| bordeaux.issue | 1-2 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01550415 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550415v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal%20of%20Electronic%20Testing:%20:%20Theory%20and%20Applications&rft.date=1999-02&rft.volume=14&rft.issue=1-2&rft.spage=57-66&rft.epage=57-66&rft.eissn=0923-8174&rft.issn=0923-8174&rft.au=ALTET,%20J.&RUBIO,%20A.&CLAEYS,%20W.&DILHAIRE,%20S.&SCHAUB,%20E.&rft.genre=article |
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