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Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique

hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorGRAUBY, Stéphane
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, S.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorJOREZ, S.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorLOPEZ, L. D. P.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorRAMPNOUX, Jean-Michel
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCLAEYS, W.
dc.date.issued2003
dc.identifier.issn1559-128X
dc.description.abstractEnno abstract
dc.language.isoen
dc.publisherOptical Society of America
dc.title.enMeasurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique
dc.typeArticle de revue
dc.identifier.doi10.1364/ao.42.001763
dc.subject.halPhysique [physics]
bordeaux.journalApplied optics
bordeaux.page1763-1768
bordeaux.volume42
bordeaux.issue10
bordeaux.peerReviewedoui
hal.identifierhal-01550902
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01550902v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied%20optics&rft.date=2003&rft.volume=42&rft.issue=10&rft.spage=1763-1768&rft.epage=1763-1768&rft.eissn=1559-128X&rft.issn=1559-128X&rft.au=GRAUBY,%20St%C3%A9phane&DILHAIRE,%20S.&JOREZ,%20S.&LOPEZ,%20L.%20D.%20P.&RAMPNOUX,%20Jean-Michel&rft.genre=article


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