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hal.structure.identifierElectronic Engineering Department
dc.contributor.authorALTET, J.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCLAEYS, W.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, S.
hal.structure.identifierHigh Performance IC Design Group, DEE
dc.contributor.authorRUBIO, A.
dc.date.issued2006
dc.identifier.issn0018-9219
dc.description.abstractEnno abstract
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers
dc.title.enDynamic surface temperature measurements in ICs
dc.typeArticle de revue
dc.identifier.doi10.1109/jproc.2006.879793
dc.subject.halPhysique [physics]
bordeaux.journalProceedings of the IEEE
bordeaux.page1519-1533
bordeaux.volume94
bordeaux.issue8
bordeaux.peerReviewedoui
hal.identifierhal-01552902
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01552902v1
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