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Measurement and modelization of silica opal reflection properties: Optical determination of the silica index

hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorAVOINE, Amaury
dc.contributor.authorHONG, Phan Ngoc
hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorFREDERICH, Hugo
hal.structure.identifierBiodiversité, Gènes & Communautés [BioGeCo]
hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorFRIGERIO, Jean-Marc
hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorCOOLEN, Laurent
hal.structure.identifierLaboratoire Kastler Brossel [LKB (Jussieu)]
dc.contributor.authorSCHWOB, Catherine
dc.contributor.authorNGA, Pham Thu
hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorGALLAS, Bruno
hal.structure.identifierInstitut des Nanosciences de Paris [INSP]
dc.contributor.authorMAÎTRE, Agnès
dc.date.issued2012
dc.identifier.issn1098-0121
dc.description.abstractEnSelf-assembled artificial opals (in particular silica opals) constitute a model system to study the optical properties of three-dimensional photonic crystals. The silica optical index is a key parameter to correctly describe an opal but is difficult to measure at the submicrometer scale and usually treated as a free parameter. Here, we propose a method to extract the silica index from the opal reflection spectra and we validate it by comparison with two independent methods based on infrared measurements. We show that this index gives a correct description of the opal reflection spectra, either by a band structure or by a Bragg approximation. In particular, we are able to provide explanations in quantitative agreement with the measurements for two features : the observation of a second reflection peak in specular direction, and the quasicollapse of the p-polarized main reflection peak at a typical angle of 54 degrees.
dc.language.isoen
dc.publisherAmerican Physical Society
dc.title.enMeasurement and modelization of silica opal reflection properties: Optical determination of the silica index
dc.typeArticle de revue
dc.identifier.doi10.1103/PhysRevB.86.165432
dc.subject.halPhysique [physics]/Matière Condensée [cond-mat]
bordeaux.journalPhysical Review B: Condensed Matter and Materials Physics (1998-2015)
bordeaux.page165432
bordeaux.volume86
bordeaux.issue16
bordeaux.peerReviewedoui
hal.identifierhal-01236777
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01236777v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Physical%20Review%20B:%20Condensed%20Matter%20and%20Materials%20Physics%20(1998-2015)&rft.date=2012&rft.volume=86&rft.issue=16&rft.spage=165432&rft.epage=165432&rft.eissn=1098-0121&rft.issn=1098-0121&rft.au=AVOINE,%20Amaury&HONG,%20Phan%20Ngoc&FREDERICH,%20Hugo&FRIGERIO,%20Jean-Marc&COOLEN,%20Laurent&rft.genre=article


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