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Reflections on the analysis of interfaces and grain boundaries by atom probe tomography

hal.structure.identifierUniversity of Oxford
dc.contributor.authorJENKINS, Benjamin M.
hal.structure.identifierGroupe de physique des matériaux [GPM]
dc.contributor.authorDANOIX, Frédéric
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGOUNÉ, Mohamed
hal.structure.identifierUniversity of Oxford
dc.contributor.authorBAGOT, Paul. A. J.
hal.structure.identifierMicrostructure Physics and Alloy Design [MPIE Düsseldorf]
dc.contributor.authorPENG, Zirong
hal.structure.identifierUniversity of Oxford
dc.contributor.authorMOODY, Michael P.
hal.structure.identifierMicrostructure Physics and Alloy Design [MPIE Düsseldorf]
hal.structure.identifierImperial College London
dc.contributor.authorGAULT, Baptiste
dc.date.issued2020
dc.identifier.issn1431-9276
dc.description.abstractEnInterfaces play critical roles in materials, and are usually both structurally and compositionally complex microstructural features. The precise characterization of their nature in three-dimensions at the atomic-scale is one of the grand challenges for microscopy and microanalysis, as this information is crucial to establish structure-property relationships. Atom probe tomography is well-suited to analyzing the chemistry of interfaces at the nanoscale. However, optimizing such microanalysis of interfaces requires great care in the implementation across all aspects of the technique, from specimen preparation to data analysis and ultimately the interpretation this information. This article provides critical perspectives on key aspects pertaining to spatial resolution limits and the issues with compositional analysis that can limit the quantification of interface measurements. Here, we use the example of grain boundaries in steels, however the results are applicable for the characterization of grain boundaries and transformation interfaces in a very wide range of industrially relevant engineering materials.
dc.language.isoen
dc.publisherCambridge University Press (CUP)
dc.title.enReflections on the analysis of interfaces and grain boundaries by atom probe tomography
dc.typeArticle de revue
dc.identifier.doi10.1017/S1431927620000197
dc.subject.halChimie/Matériaux
dc.identifier.arxiv1806.03851
bordeaux.journalMicroscopy and Microanalysis
bordeaux.page247-257
bordeaux.volume26
bordeaux.issue2
bordeaux.peerReviewedoui
hal.identifierhal-02533984
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-02533984v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microscopy%20and%20Microanalysis&rft.date=2020&rft.volume=26&rft.issue=2&rft.spage=247-257&rft.epage=247-257&rft.eissn=1431-9276&rft.issn=1431-9276&rft.au=JENKINS,%20Benjamin%20M.&DANOIX,%20Fr%C3%A9d%C3%A9ric&GOUN%C3%89,%20Mohamed&BAGOT,%20Paul.%20A.%20J.&PENG,%20Zirong&rft.genre=article


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