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Structure and electrical properties of sputtered lithium cobaltite thin films

hal.structure.identifierSolid State and Structural Chemistry Unit, Material Research Center
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorRAO, Kalya J.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorBENQLILOU-MOUDDEN, Hanane
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCOUTURIER, Gérard
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorVINATIER, Philippe
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLEVASSEUR, Alain
dc.date.issued2002
dc.identifier.issn0025-5408
dc.description.abstractEnLixCoOy films with x<1 and y>2 have been prepared by radio-frequency (rf) sputtering from high temperature (HT) LiCoO2 targets. Their structures have been examined with high resolution electron microscopy. Conductivities have been studied between 77 and 400 K. The electrochemical behaviour of film electrodes have been investigated with Li/LiClO4-PC/LixCoOy cells. The annealed films consist of nanocrystalline domains with amorphous boundaries. Electrical conductivities appear to arise from variable-range hopping (VRH) of holes. The films form good electrodes with operating potentials between 2.7 and 3.8 V. The observations have been discussed on the basis of a tentative and heuristic molecular orbital based energy band diagram.
dc.language.isoen
dc.publisherElsevier
dc.title.enStructure and electrical properties of sputtered lithium cobaltite thin films
dc.typeArticle de revue
dc.identifier.doi10.1016/S0025-5408(02)00756-0
dc.subject.halChimie/Matériaux
bordeaux.journalMaterials Research Bulletin
bordeaux.page1353-1367
bordeaux.volume37
bordeaux.issue7
bordeaux.peerReviewedoui
hal.identifierhal-00728211
hal.version1
hal.popularnon
hal.audienceInternationale
dc.subject.esX-ray diffraction
dc.subject.esElectrical properties
dc.subject.esMicrostructure
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00728211v1
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