Afficher la notice abrégée

dc.rights.licenseopenen_US
dc.contributor.authorDARNON, Maxime
dc.contributor.authorDE LAFONTAINE, Mathieu
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorALBERT, Pierre
dc.contributor.authorJOUANNEAU, Corentin
dc.contributor.authorBIDAUD, Thomas
dc.contributor.authorDUBUC, Christian
dc.contributor.authorVOLATIER, Maïté
dc.contributor.authorAIMEZ, Vincent
dc.contributor.authorJAOUAD, Abdelatif
dc.contributor.authorHAMON, Gwenaelle
dc.date.accessioned2022-07-08T08:49:54Z
dc.date.available2022-07-08T08:49:54Z
dc.date.issued2022-03-04
dc.date.conference2022-01-22
dc.identifier.urioai:crossref.org:10.1117/12.2613441
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/140404
dc.description.abstractEnConcentrator photovoltaic (CPV) technologies provide the highest photovoltaic conversion efficiency but remain too expensive for very large scale development. Reduction of the dimension (micro-CPV) is a promising approach towards cost reduction but necessitates sub-millimeter-scale high efficiency solar cells. In this paper, we review the challenges faced by sub-millimeter-scale solar cells for application in micro-CPV. We show that plasma etching processes are necessary to fabricate sub-millimeter-scale high-efficiency solar cells to avoid a waste of material in the isolation and dicing lines. We also show that despite the cell performance is known to degrade when the dimension of the cell is downscaled, this degradation can be negligible when optimized etching and passivation processes are used and when the cell operates under high concentration (<500x). The through-cell via contact architecture is a promising approach to avoid bus bars on the front side and therefore optimize the wafer usage and minimize dark current. Combining all these solutions, we claim that sub-millimeter-scale high efficiency solar cells as small as 0.01 mm2 can be fabricated with more than 90% of wafer material used for photovoltaic conversion and without performance degradation when operating under 1,000x concentration compared to 1 mm2 solar cells operating under 500x concentration. Challenges on characterization and in-line metrology remain to be solved and manufacturing lines need now to be adapted to provide commercial solutions for micro-CPV.
dc.language.isoENen_US
dc.publisherSPIEen_US
dc.sourcecrossref
dc.subject.enSolar cells
dc.subject.enPlasma etching
dc.subject.enSemiconducting wafers
dc.subject.enMultijunction solar cells
dc.subject.enPhotovoltaics
dc.subject.enSolar concentrators
dc.subject.enSun
dc.title.enSub-millimeter-scale multijunction solar cells for concentrator photovoltaics (CPV)
dc.typeCommunication dans un congrès avec actesen_US
dc.identifier.doi10.1117/12.2613441en_US
dc.subject.halSciences de l'ingénieur [physics]/Traitement du signal et de l'imageen_US
bordeaux.hal.laboratoriesLaboratoire d’Intégration du Matériau au Système (IMS) - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.titleSPIE OPTO, 2022en_US
bordeaux.countryusen_US
bordeaux.title.proceedingProceedings Volume 11996, Physics, Simulation, and Photonic Engineering of Photovoltaicen_US
bordeaux.conference.citySan Franciscoen_US
bordeaux.peerReviewedouien_US
bordeaux.import.sourcedissemin
hal.identifierhal-03781347
hal.version1
hal.date.transferred2022-09-20T09:51:32Z
hal.exporttrue
workflow.import.sourcedissemin
dc.rights.ccPas de Licence CCen_US
bordeaux.COinSctx_ver=Z39.88-2004&amp;rft_val_fmt=info:ofi/fmt:kev:mtx:journal&amp;rft.date=2022-03-04&amp;rft.au=DARNON,%20Maxime&amp;DE%20LAFONTAINE,%20Mathieu&amp;ALBERT,%20Pierre&amp;JOUANNEAU,%20Corentin&amp;BIDAUD,%20Thomas&amp;rft.genre=proceeding


Fichier(s) constituant ce document

FichiersTailleFormatVue

Il n'y a pas de fichiers associés à ce document.

Ce document figure dans la(les) collection(s) suivante(s)

Afficher la notice abrégée