Recherche
-
Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
(Microelectronics Reliability. vol. 39, pp. 1, 1999)Article de revue -
Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
(Microelectronics Reliability. vol. 1, pp. 1, 2003)Article de revue -
Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
(Microelectronics Reliability. vol. 1, pp. 1, 2003)Article de revue