Recherche
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Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
(Microelectronics Reliability. vol. 39, pp. 1, 1999)Article de revue -
Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
(Microelectronics Reliability. vol. 1, pp. 1, 2003)Article de revue -
Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés
(Colloque Interdisciplinaire en Instrumentation (C2I), FR, 2004)Communication dans un congrès avec actes -
Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
(Microelectronics Reliability. vol. 1, pp. 1, 2003)Article de revue