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Strain energy imaging of a power MOS transistor using speckle interferometry
(IEEE Transactions on Reliability. vol. 53, n° 2, pp. 293-296, 2004-06)Article de revue -
Laser diode light efficiency determination by thermoreflectance microscopy
(Microelectronics Journal. vol. 32, n° 10-11, pp. 899-901, 2001-10)Article de revue -
Dynamical behavior and cut-off frequency of Si/SiGe microcoolers
(Superlattices and Microstructures. vol. 41, n° 1, pp. 7-16, 2007)Article de revue -
Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics
(Journal of Applied Physics. vol. 101, n° 1, pp. 7, 2007)Article de revue -
Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature
(International Journal of Thermal Sciences. vol. 45, n° 5, pp. 443-451, 2006)Article de revue -
Simulation of Si/SiGe micro-cooler by thermal quadrupoles method
Communication dans un congrès -
Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses
(Physical Review Letters. vol. 94, n° 16, pp. 4, 2005)Article de revue -
Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature
(International Journal of Thermal Sciences. vol. 45, n° 5, pp. 443-451, 2006-05)Article de revue -
Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature
(Inverse Problems in Science and Engineering. vol. 15, n° 1, pp. 77-89, 2007-01)Article de revue -
Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature
(Review of Scientific Instruments. vol. 76, n° 6, pp. 064901, 2005-06)Article de revue