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Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
(Superlattices and Microstructures. vol. 38, n° 1, pp. 69-75, 2005-07-06)Article de revue -
Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis
(IEEE Electron Device Letters. vol. 26, n° 7, pp. 461-463, 2005-07)Article de revue -
Study of thermomechanical properties of Si/SiGe superlattices using femtosecond transient thermoreflectance technique
(Applied Physics Letters. vol. 87, n° 10, pp. 103506 (1-3), 2005-09-05)Article de revue -
Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging
(IEEE Electron Device Letters. vol. 26, n° 2, pp. 78-80, 2005-02)Article de revue -
Simulation of Si/SiGe micro-cooler by thermal quadrupoles method
Communication dans un congrès -
Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses
(Physical Review Letters. vol. 94, n° 16, pp. 4, 2005)Article de revue -
Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature
(Review of Scientific Instruments. vol. 76, n° 6, pp. 064901, 2005-06)Article de revue -
Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques
Communication dans un congrès -
Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
Communication dans un congrès