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Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics
(Journal of Applied Physics. vol. 101, n° 1, pp. 7, 2007)Article de revue -
Simulation of Si/SiGe micro-cooler by thermal quadrupoles method
Communication dans un congrès -
Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques
Communication dans un congrès -
Four different approaches for the measurement of IC surface temperature: application to thermal testing
(Microelectronics Journal. vol. 33, n° 9, pp. 689-696, 2002-09-01)Article de revue -
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
(Microelectronics Journal. vol. 35, n° 10, pp. 797-803, 2004-10)Article de revue -
Joule Expansion Imaging Techniques on Microlectronic Devices
Communication dans un congrès -
Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique
Communication dans un congrès