Recherche
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Laser probes for the thermal and thermomechanical characterisation of microelectronic devices
(Microelectronics Journal. vol. 32, n° 10-11, pp. 891-898, 2001-10)Article de revue -
Localisation of devices acting as heat sources in ICs covered entirely by metal layers
(Electronics Letters. vol. 39, n° 20, pp. 1440-1442, 2003)Article de revue -
Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions
(Applied Physics Letters. vol. 84, n° 5, pp. 822-824, 2004-02-02)Article de revue -
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy
(Microelectronics Journal. vol. 35, n° 10, pp. 811-816, 2004-10)Article de revue -
Determination of ZT of PN thermoelectric couples by AC electrical measurement
Communication dans un congrès -
Applications of temperature phase measurements to IC testing
(Microelectronics Reliability. vol. 44, n° 1, pp. 95-103, 2004-01)Article de revue -
Surface displacement imaging by interferometry with a light emitting diode
(Applied optics. vol. 41, n° 24, pp. 4996-5001, 2002-08-20)Article de revue -
Laser diode COFD analysis by thermoreflectance microscopy
(Microelectronics Reliability. vol. 41, n° 9-10, pp. 1597-1601, 2001-09)Article de revue -
Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures
Communication dans un congrès -
Thermal coupling in integrated circuits: Application to thermal testing
(IEEE Journal of Solid-State Circuits. vol. 36, n° 1, pp. 81-91, 2001-01)Article de revue