Recherche
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A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements
(International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, se, Goteborg, 2022-10-05)Communication dans un congrès avec actesLibre accès -
S-Parameter Measurement and EM Simulation of Electronic Devices towards THz frequency range
(2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), us, Cleveland, OH, 2022-09-26)Communication dans un congrès avec actesLibre accès