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S-Parameter Measurement and EM Simulation of Electronic Devices towards THz frequency range
(2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), us, Cleveland, OH, 2022-09-26)Communication dans un congrès avec actesLibre acceso