Structural and textural analyses of SiC-based and carbon CVD coatings by Raman Microspectroscopy
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EN
Article de revue
Este ítem está publicado en
Thin Solid Films. 2007-12-03, vol. 516, n° 2-4, p. 388-396
Resumen en inglés
The polarization properties of Raman scattering have been utilized for the texture analysis of SiC-based and carbon coatings processed by CVD. A polarized Raman scattering analysis of the optical phonons was conducted to ...Leer más >
Palabras clave en inglés
Raman spectroscopy
Microstructure
Microtexture
Silicon carbide
Pyrocarbon
Chemical vapour deposition (CVD)