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dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorGUILLET, Jean Paul
ORCID: 0000-0003-4434-8052
IDREF: 151192669
dc.contributor.authorRIOULT, Jean
dc.contributor.authorGAQUIERE, Christophe
dc.date.accessioned2023-10-19T12:27:11Z
dc.date.available2023-10-19T12:27:11Z
dc.date.issued2023
dc.date.conference2023-08-20
dc.identifier.urioai:crossref.org:10.1117/12.2681926
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/184488
dc.description.abstractWe present original work on non-destructive testing with an imaging solution combining a sensor that can measure the millimeter-wave radiation of a black body at temperatures between 290-400°K and a portable solution based on augmented reality with a smartphone. This handy portable solution makes it possible to do away with mechanical scanning systems which are heavy and slow, and therefore may be suitable for civil engineering detection or imaging applications, or in the field of aeronautics.
dc.language.isoENen_US
dc.publisherSPIEen_US
dc.sourcecrossref
dc.subjectTHz characterization passive imaging zero power blackbody source Augmented reality smartphone non destructive testing
dc.subjectTerahertz imaging
dc.subjectTHz characterization
dc.subjectPassive imaging
dc.subjectZero power
dc.subjectBlackbody source
dc.subjectAugmented reality
dc.subjectSmartphone
dc.subjectNon destructive testing
dc.subjectTerahertz applications
dc.titleTests non destructifs térahertz basés sur une source de corps noir avec réalité augmentée
dc.title.enBlackbody source-based terahertz nondestructive testing with augmented reality
dc.typeCommunication dans un congrèsen_US
dc.identifier.doi10.1117/12.2681926en_US
dc.subject.halSciences de l'ingénieur [physics]/Electromagnétismeen_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.titleSPIE Optical Engineering + Applications, 2023en_US
bordeaux.countryusen_US
bordeaux.title.proceedingProceedings Volume 12683, Terahertz Emitters, Receivers, and Applications XIVen_US
bordeaux.teamNANOELECTRONICS-LASERen_US
bordeaux.conference.citySan Diegoen_US
bordeaux.import.sourcedissemin
hal.invitedouien_US
hal.proceedingsouien_US
hal.conference.end2023-08-24
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exportfalse
workflow.import.sourcedissemin
dc.rights.ccPas de Licence CCen_US
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