A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction
PACANOWSKI, Romain
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Melting the frontiers between Light, Shape and Matter [MANAO]
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Melting the frontiers between Light, Shape and Matter [MANAO]
PACANOWSKI, Romain
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Melting the frontiers between Light, Shape and Matter [MANAO]
< Réduire
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Melting the frontiers between Light, Shape and Matter [MANAO]
Langue
en
Article de revue
Ce document a été publié dans
ACM Transactions on Graphics. 2017-07-20, vol. 36, n° 4, p. 12
Association for Computing Machinery
Résumé en anglais
Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They ...Lire la suite >
Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances.< Réduire
Mots clés en anglais
diffraction
material models
CCS Concepts: Computing methodologies → Reflectance modeling
BRDF
Project ANR
Reproduction de textures d'objets d'art ancien à base de micro-géométrie - ANR-15-CE38-0005
Origine
Importé de halUnités de recherche