A View-Dependent Metric for Patch-Based LOD Generation & Selection
Idioma
en
Article de revue
Este ítem está publicado en
Proceedings of the ACM on Computer Graphics and Interactive Techniques. 2018-05-15, vol. 1, n° 1
ACM
Resumen en inglés
With hardware tessellation, highly detailed geometric models are decomposed into patches whose tessellation factor can be specified dynamically and independently at render time to control polygon resolution. Yet, to achieve ...Leer más >
With hardware tessellation, highly detailed geometric models are decomposed into patches whose tessellation factor can be specified dynamically and independently at render time to control polygon resolution. Yet, to achieve maximum efficiency, an appropriate factor needs to be selected for each patch according to its content (geometry and appearance) and the current viewpoint distance and orientation. We propose a novel patch-based error metric that addresses this problem. It summarizes both the geometrical error and the texture parametrization deviation of a simplified patch compared to the corresponding detailed surface. This metric is compact and can be efficiently evaluated on the GPU along any view direction. Furthermore, based on this metric, we devise an easy-to-implement refitting optimization that further reduces the simplification error of any decimation algorithm, and propose a new placement strategy and cost function for edge-collapses to reach the best quality/performances trade-off.< Leer menos
Palabras clave en inglés
Level-of-details
Hardware tessellation
Mesh simplification
Orígen
Importado de HalCentros de investigación