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Strong Light Intensifications Yielded by Arbitrary Defects: Fresnel Diffraction Theory Applied to a Set of Opaque Disks

hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorTOURNEMENNE, F.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorBOUILLET, S.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorROUYER, C.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorLEYMARIE, C.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorIRIONDO, J.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorDA COSTA FERNANDES, B.
hal.structure.identifierCommissariat à l'énergie atomique et aux énergies alternatives [CEA]
dc.contributor.authorGABORIT, G.
hal.structure.identifierLaboratoire Photonique, Numérique et Nanosciences [LP2N]
dc.contributor.authorBATTELIER, B.
hal.structure.identifierCLARTE [CLARTE]
dc.contributor.authorBONOD, N.
dc.date.accessioned2023-05-12T10:43:22Z
dc.date.available2023-05-12T10:43:22Z
dc.date.issued2019-03
dc.identifier.issn2331-7019
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/181675
dc.description.abstractEnTwo centuries ago, Fresnel, Poisson, and Arago showed how the wave nature of light induces a bright spot behind an opaque disk. We develop an analytical model based on the Fresnel diffraction theory to show how small perturbations such as digs or scratches can yield intense light enhancements on the downstream axis. The impact of defects with complex morphology on light diffraction is shown to be accurately modeled by the Fresnel theory applied to a set of opaque disks characterized by phase shift and trans-mittance. This model can be used either to define the geometry of the defects that optimizes the light enhancement or to improve the defect specification on the surface of the optical components. We explain why partial information of the defect morphology can suffice to specify a safety distance beyond which light intensifications are not dangerous. The validity of this analytical approach is studied by measuring the intensifications created by three different microdefects.
dc.language.isoen
dc.publisherAmerican Physical Society
dc.title.enStrong Light Intensifications Yielded by Arbitrary Defects: Fresnel Diffraction Theory Applied to a Set of Opaque Disks
dc.typeArticle de revue
dc.identifier.doi10.1103/PhysRevApplied.11.034008
dc.subject.halSciences de l'ingénieur [physics]/Optique / photonique
bordeaux.journalPhysical Review Applied
bordeaux.volume11
bordeaux.hal.laboratoriesLaboratoire Photonique, Numérique et Nanosciences (LP2N) - UMR 5298*
bordeaux.issue3
bordeaux.institutionUniversité de Bordeaux
bordeaux.institutionCNRS
bordeaux.peerReviewedoui
hal.identifierhal-02398187
hal.version1
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-02398187v1
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