Bi-directional spectral broadening measurements for accurate characterisa- tion of nonlinear hybrid integrated waveguides
DYATLOV, Mikhail
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Centre de Nanosciences et de Nanotechnologies [C2N]
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Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Centre de Nanosciences et de Nanotechnologies [C2N]
DYATLOV, Mikhail
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Centre de Nanosciences et de Nanotechnologies [C2N]
< Reduce
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Centre de Nanosciences et de Nanotechnologies [C2N]
Language
en
Communication dans un congrès avec actes
This item was published in
EOS Annual meeting "TOM1: Silicon Photonics and Guided-Wave Optics", 2022-09-12, Porto.
Origin
Hal imported